Remove side affect from test assertion, to avoid different behaviour in
non-debug build. Issues reported by coverity scan.

Coverity issue: 385419, 385420
Fixes: 6f00462979ad ("test/pdcp: add timer expiry cases")

Signed-off-by: Volodymyr Fialko <vfia...@marvell.com>
---
 app/test/test_pdcp.c | 6 ++++--
 1 file changed, 4 insertions(+), 2 deletions(-)

diff --git a/app/test/test_pdcp.c b/app/test/test_pdcp.c
index 423526380f..6c73c1db36 100644
--- a/app/test/test_pdcp.c
+++ b/app/test/test_pdcp.c
@@ -1338,8 +1338,9 @@ test_expiry_with_event_timer(const struct pdcp_test_conf 
*ul_conf)
        while (n != 1) {
                rte_delay_us(testsuite_params.min_resolution_ns / 1000);
                n = rte_event_dequeue_burst(testsuite_params.evdev, 
TEST_EV_PORT_ID, &event, 1, 0);
-               ASSERT_TRUE_OR_GOTO(nb_try-- > 0, exit,
+               ASSERT_TRUE_OR_GOTO(nb_try > 0, exit,
                                "Dequeued unexpected timer expiry event: %i\n", 
n);
+               nb_try--;
        }
 
        ASSERT_TRUE_OR_GOTO(event.event_type == RTE_EVENT_TYPE_TIMER, exit, 
"Unexpected event type\n");
@@ -1433,8 +1434,9 @@ test_expiry_with_rte_timer(const struct pdcp_test_conf 
*ul_conf)
        while (timer_args.status != 1) {
                rte_delay_us(1);
                rte_timer_manage();
-               ASSERT_TRUE_OR_GOTO(nb_try-- > 0, exit, "Bad expire handle 
status %i\n",
+               ASSERT_TRUE_OR_GOTO(nb_try > 0, exit, "Bad expire handle status 
%i\n",
                        timer_args.status);
+               nb_try--;
        }
 
        ret = TEST_SUCCESS;
-- 
2.34.1

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