Remove side affect from test assertion, to avoid different behaviour in non-debug build. Issues reported by coverity scan.
Coverity issue: 385419, 385420 Fixes: 6f00462979ad ("test/pdcp: add timer expiry cases") Signed-off-by: Volodymyr Fialko <vfia...@marvell.com> --- app/test/test_pdcp.c | 6 ++++-- 1 file changed, 4 insertions(+), 2 deletions(-) diff --git a/app/test/test_pdcp.c b/app/test/test_pdcp.c index 423526380f..6c73c1db36 100644 --- a/app/test/test_pdcp.c +++ b/app/test/test_pdcp.c @@ -1338,8 +1338,9 @@ test_expiry_with_event_timer(const struct pdcp_test_conf *ul_conf) while (n != 1) { rte_delay_us(testsuite_params.min_resolution_ns / 1000); n = rte_event_dequeue_burst(testsuite_params.evdev, TEST_EV_PORT_ID, &event, 1, 0); - ASSERT_TRUE_OR_GOTO(nb_try-- > 0, exit, + ASSERT_TRUE_OR_GOTO(nb_try > 0, exit, "Dequeued unexpected timer expiry event: %i\n", n); + nb_try--; } ASSERT_TRUE_OR_GOTO(event.event_type == RTE_EVENT_TYPE_TIMER, exit, "Unexpected event type\n"); @@ -1433,8 +1434,9 @@ test_expiry_with_rte_timer(const struct pdcp_test_conf *ul_conf) while (timer_args.status != 1) { rte_delay_us(1); rte_timer_manage(); - ASSERT_TRUE_OR_GOTO(nb_try-- > 0, exit, "Bad expire handle status %i\n", + ASSERT_TRUE_OR_GOTO(nb_try > 0, exit, "Bad expire handle status %i\n", timer_args.status); + nb_try--; } ret = TEST_SUCCESS; -- 2.34.1