Re: [dpdk-dev] [PATCH v3] test: reduce test duration for efd autotest

[Thomas Monjalon]

Still no review for this patch?

20/01/2019 22:25, Thomas Monjalon:
> Any review please?
> 
> 29/11/2018 08:36, Jananee Parthasarathy:
> > Reduced test time for efd_autotest.
> > Key length is updated, invoke times of random function is reduced.
> > Different value is updated for each hash key entry.
> > 
> > Signed-off-by: Jananee Parthasarathy <jananeex.m.parthasara...@intel.com>