[dpdk-dev] [PATCH v3 2/6] test/hash: change multiwriter test to use jhash

[Yipeng Wang]

With sequential key, the test will cover more corner
cases with jhash instead of crc hash, since jhash
generates more random hash pattern on sequential key.
It is useful for functional verification.

Signed-off-by: Yipeng Wang <yipeng1.w...@intel.com>
---
 test/test/test_hash_multiwriter.c | 3 ++-
 1 file changed, 2 insertions(+), 1 deletion(-)

diff --git a/test/test/test_hash_multiwriter.c 
b/test/test/test_hash_multiwriter.c
index 6a3eb10..d447f6d 100644
--- a/test/test/test_hash_multiwriter.c
+++ b/test/test/test_hash_multiwriter.c
@@ -12,6 +12,7 @@
 #include <rte_malloc.h>
 #include <rte_random.h>
 #include <rte_spinlock.h>
+#include <rte_jhash.h>
 
 #include "test.h"
 
@@ -108,7 +109,7 @@ test_hash_multiwriter(void)
        struct rte_hash_parameters hash_params = {
                .entries = nb_entries,
                .key_len = sizeof(uint32_t),
-               .hash_func = rte_hash_crc,
+               .hash_func = rte_jhash,
                .hash_func_init_val = 0,
                .socket_id = rte_socket_id(),
        };
-- 
2.7.4