Benjamin Herrenschmidt wrote: > Looks like your drive lockups occasionally... have you tried running > some SMART checks on it ? Sounds pretty bad to me... unless there is > a problem with the timings set by the driver but I pretty sure I use the > same ones as MacOS X ... >
Ok, I ran some SMART checks with smartctl from smartmontools. I've attached the output from "smartctl -a /dev/hda" after having done both the short and extended self-test with smartctl. I do not really understand very much of its output :-(, but I hope it is what you need to figure out if the disk is ok. By the way, it is the _original_ disk of the ibook, I never replaced it. Thanks, Vivenzio
smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: Hitachi IC25N040ATMR04-0 Serial Number: MRG223K2FB1WBP Firmware Version: MO2AAD0A Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 6 ATA Standard is: ATA/ATAPI-6 T13 1410D revision 3a Local Time is: Thu Jul 21 22:07:01 2005 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 645) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 37) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail Always - 65536 2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0 3 Spin_Up_Time 0x0007 169 169 033 Pre-fail Always - 1 4 Start_Stop_Count 0x0012 094 094 000 Old_age Always - 9757 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0 9 Power_On_Hours 0x0012 099 099 000 Old_age Always - 750 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1254 191 G-Sense_Error_Rate 0x000a 095 095 000 Old_age Always - 589825 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 22 193 Load_Cycle_Count 0x0012 095 095 000 Old_age Always - 54615 194 Temperature_Celsius 0x0002 134 134 000 Old_age Always - 41 (Lifetime Min/Max 15/55) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 750 - # 2 Short offline Completed without error 00% 748 - Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum. SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
