Dear All,

Sayan Bhakta and I have recently posted the preprint of a review on
resolution and linearity which will appear in a book to be launched on the
16th of October 2024.
( https://doi.org/10.1201/9781003326106 ).
It is the first Cryo-EM review that I have been involved in for 25 years.
In our preparation, I was quite amazed about what other authors wrote (or
did not write) in their many reviews on these matters.
For example, I missed any serious discussion about resolution metrics in
X-ray crystallography, which technique is fundamentally non-linear.
Linearity is a prerequisite for defining the resolution of any instrument.
The iterative refinements applied in X-ray crystallography (and sometimes
Cryo-EM) makes that all Phase-residuals and R-factors or fixed threshold
values cannot be used to compare the results of independently conducted
experiments. What is an obvious consequence of the lack of universality of
such metrics like phase-residuals and R-factors, is that they cannot be
used outside of the immediate context in which they were defined, like
X-ray crystallography or structural biology.  In contrast, the
Fourier-Ring-Correlation (FRC); Fourier-Shell-Correlation (FSC) and their
recent successors: the Fourier-Ring-Information (FRI) and the
Fourier-Shell-Information (FSI), plus their integrated versions, are
universal metrics that are applicable to all fields of science where 2D and
3D data are dealt with!

https://doi.org/10.31219/osf.io/5empt

Have fun reading it!

Marin

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