Jacob-

Based on your question, you would likely be interested in doing some
literature searches for the pioneering work of George Phillips and the
utilization of diffuse scattering information.  What you are thinking
about has already been broached - nearly 20 yrs ago.  It is likely that
a revisitation of this topic could be fruitful in certain cases.

Best regards,

Steve 

-----Original Message-----
From: CCP4 bulletin board [mailto:ccp...@jiscmail.ac.uk] On Behalf Of
Jacob Keller
Sent: Wednesday, January 20, 2010 12:47 PM
To: CCP4BB@JISCMAIL.AC.UK
Subject: [ccp4bb] Refining against images instead of only reflections

Dear Crystallographers,

One can see from many posts on this listserve that in any given x-ray 
diffraction experiment, there are more data than merely the diffraction 
spots. Given that we now have vastly increased computational power and
data 
storage capability, does it make sense to think about changing the
paradigm 
for model refinements? Do we need to "reduce" data anymore? One could 
imagine applying various functions to model the intensity observed at
every 
single pixel on the detector. This might be unneccesary in many cases,
but 
in some cases, in which there is a lot of diffuse scattering or other 
phenomena, perhaps modelling all of the pixels would really be more true
to 
the underlying phenomena? Further, it might be that the gap in R values 
between high- and low-resolution structures would be narrowed
significantly, 
because we would be able to model the data, i.e., reproduce the images
from 
the models, equally well for all cases. More information about the
nature of 
the underlying macromolecules might really be gleaned this way. Has this

been discussed yet?

Regards,

Jacob Keller

*******************************************
Jacob Pearson Keller
Northwestern University
Medical Scientist Training Program
Dallos Laboratory
F. Searle 1-240
2240 Campus Drive
Evanston IL 60208
lab: 847.491.2438
cel: 773.608.9185
email: j-kell...@northwestern.edu
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